The aim of the IUVSTA workshop on Advances in the characterization of surface engineering structures, coatings, and thin films is to address significant advances in characterization techniques for nanostructure, composition and properties of surface engineering structures, coatings and thin films within the past decade. Invited talks given by well recognized experts will cover mainly, but not only, (synchrotron) X-ray diffraction based techniques, scanning and transmission electron microscopy, atom probe tomography, micro-mechanical testing and in-situ/in-operando and temperature variable setups. The necessity to use a combination of advanced characterization techniques to fully understand composition-structure-properties relationships will be highlighted.

The topical key areas of the workshop will be divided into three groups:

• microstructural, chemical and residual stress characterization,
• nano-/micro-mechanics,
• in-situ/in-operando studies and thermal properties

The workshop is intended to provide a forum and networking venue for scientists, engineers and technologist from academia, government laboratories and industry.

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Important dates